ED-XRF Analysis

The ED-XRF Analysis is a method for measuring the thickness of coatings and for analysing materials.

 XRF can be used for the qualitative and quantitative determination of the elemental composition of a material sample as well as for measuring coating thickness and coating systems. In both laboratory and industrial environments, the ED-XRF method is now well established and can be readily utilised with modern equipment.ITA Labs uses a Fischerscope XDAL XRF for ED-XRF analysis.

Typical applications:

• RoHS Screening
• Plating thickness measurements
• Other XRF testing applications

ITA Labs’ UK laboratory is experienced at providing thickness measurement and material analysis, with a fast turnaround, at very competitive rates using a Fischerscope XDAL XRF.

ITA Labs has UKAS 17025-2017 accreditation for this technique.

A short video about ED-XRF analysis can be viewed below.

To discuss your potential requirements, call Mark on 01727 871316.